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Material Classification Using Raw Time-Of-Flight Measurements
AbstractWe propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials.
Related Material
[pdf][bibtex]@InProceedings{Su_2016_CVPR,
author = {Su, Shuochen and Heide, Felix and Swanson, Robin and Klein, Jonathan and Callenberg, Clara and Hullin, Matthias and Heidrich, Wolfgang},
title = {Material Classification Using Raw Time-Of-Flight Measurements},
booktitle = {Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2016}
}
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